IC Test & Measurement

Design Technology Evaluation Group
Analogue bandwidth: 50MHz. 26 bit LF digitising, 16 bit HF digitising. Digital: 400MHz/50pS/160 channels. Timing & vector. Iddq, Schmoo& Scan-path testing. EDA link s/w. AC Capability: 32GHz signal analysis. fF Capacitance. Noise analysis, spectrum analysis & impedance measurement. Temperature Capability: -70°C --> +225°C
Analogue bandwidth: 50MHz. 26 bit LF digitising, 16 bit HF digitising. Digital: 400MHz/50pS/160 channels. Timing & vector. Iddq, Schmoo& Scan-path testing. EDA link s/w. AC Capability: 32GHz signal analysis. fF Capacitance. Noise analysis, spectrum analysis & impedance measurement. Temperature Capability: -70°C --> +225°C

Design Characterisation

We perform independent electrical characterisation of analog, digital and ‘mixed signal’ integrated circuit components for industry. We have decades of experience characterising new IC designs and we are particularly strong in ‘mixed signal’ and analog component electrical evaluation. We have well equipped test and measurement laboratories in which we perform:

 

  • IC design characterisation of new & re-designed IC’s
  • Electrical evaluation of competing products
  • Application specific compatibility resolutions
  • Acquiring in-depth performance data not already documented
  • Measurements to facilitate IC re-design for more competitive performance and cost
  • Diagnostic work & failure evaluation
  • ‘Smart Card’ IC evaluation.

Example of IC's characterised recently include: Standard ADCs, Sigma/Delta Converters, DACs, Phase Lock Loops, Voltage regulators, Precision references, Op-Amps, Switches, Multiplexers, Standard Digital IC's

Contact: 

Ted O'Shea
Head, Design Technology Evaluation
E: ted.oshea@tyndall.ie
T: +353 21 4904159

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