|
Electrochemical deposition with specific relevance to the
microelectronic industry has been investigated at Tyndall for more
than 15 years. R&D is focussed on the use of electrolytic and
electroless deposition of materials for ICT applications and the
microfabrication of electrochemical devices, microbatteries and
microfuel cells. We also develop lithographic processes to achieve
the desired patterning for selective deposition. The laboratory
houses dedicated lithography, deposition and characterisation
equipment for advanced materials processing. A wide variety of
substrate materials have been investigated including metals,
ceramics, polymers, semiconductors and compound semiconductors.
We are currently investigating electroless and electrolytic
deposition for controllled deposition at the micro/nanoscale. The
following shows one aspect of the the electrochemical deposition R&D
at Tyndall, templated nanoscale electroless deposition
Anodised aluminium oxide (AAO) and ion beam track etched polycarbonate
(PC) substrates are used as templates to deposit metal nanotubes. Single
metal tubes have been achieved previously by other researchers. In this
collaboration with the Chemistry Derpartment at UCC we investigated
coaxial tubes metals and alloys. The results demonstrate the possibility
for controlled low cost deposition of metals and alloys as nanoscale
deposits in templates

Figure 1. Polycarbonate membrane and the resulting nanotubes
formed in this template following electroless processing. Coaxial metals
and alloys of CoNIFe inside Ni have been achieved
Recent
projects
-
Low cost metal contacts for gallium nitride.
Enterprise Ireland
Proof of Concept, commercialisation fund project (2007)
-
Electrodeposited copper composites for advanced IC interconnect.
(2007-2010) Irish Research Council for Science Engineering and
Technology Embark Partnership
scheme scholarship with Intel Ireland.
-
Electroless deposition.
(2006-2008) Enterprise
Ireland Innovation Partnership scheme
Recent
publications
-
L.C.Nagle and J.F.Rohan, J.
Power Sources, 185 (2008) 411-418. Aligned carbon nanotube
composite deposition in platinum for fuel cell catalysts.
-
J.F.Rohan, D.P.Casey, B.Ahern,
F.M.F.Rhen, S.Roy, D.Fleming and S.E.Lawrence, Electrochemistry
Communications, 10 (2008) 1419-1422. Coaxial metal and
magnetic alloy nanotubes in polycarbonate templates by electroless
deposition.
-
L.Lewis, D.P.Casey,
A.V.Jeyaseelan, J.F.Rohan and P.Maaskant, Applied Physics Letters,
92 (2008) 062113. Electroless nickel/gold ohmic contacts
to p-type GaN.
-
C.Ó.Mathúna, T.O’Donnell,
R.Martinez, J.F.Rohan and B.O’Flynn, Talanta, 75 (2008) 613-623.
Energy Scavenging for Long-Term Deployable Mote Networks
-
W-M.Chen, P.McCloskey, J.F.Rohan, P.Byrne and
P.J.McNally, IEEE Transactions on Components, Packaging and
Manufacturing Technology, Part A, 30 1 (2007) 144-151,
Preparation and temperature cycling reliability of electroless Ni
under bump metallization.
-
L.C.Nagle, A.Loughlin and J.F.Rohan,
Electrochemical Society Transactions, Vol 2, 6, (2007) 51-59.
Electroless cobalt deposition from ammonia borane solutions.
-
L.C.Nagle and J.F.Rohan, Journal of the
Electrochem. Society, 153 (11) C773-C776 (2006) Ammonia borane
oxidation at gold microelectrodes in alkaline solutions,
-
J.F.Rohan, B.M.Ahern and L.C.Nagle,
Electrochemical Society Transactions, Vol 1, Issue 31, 1-9 (2006)
DMAB Oxidation for Electroless Deposition from Alkaline Solutions.
-
P.P.Maaskant, M.Akhter, N.Cordero, D.P.Casey,
J.F.Rohan, B.J.Roycroft and B.Corbett, Physica Status Solidi (c) 2,
No 7, 2907 - 2911 (2005) LED flip-chip assembly with
electroplated AuSn alloy.
-
L.C.Nagle and J.F.Rohan, Electrochemical and
Solid-State Letters, 8 (5) C77-C80 (2005) Investigation of
dimethylamine borane oxidation at a gold microelectrode in base.
-
J.F.Rohan, P.A.Murphy and J.Barrett, Journal of
the Electrochemical Society, 152, C32-C35 (2005) Zincate-free,
electroless nickel deposition at aluminium bond pads
-
W.M.Chen, P.McCloskey, P.Byrne, P.Cheasty,
G.Duffy, J.F.Rohan, J.Boardman, A.Mulcahy and S.C.O'Mathuna, Journal
of Electronic Materials, 33 (2004) 900-907. Degradation of
electroless Ni(P) under bump metallization (UBM) in Sn3.5Ag and
Sn37Pb solders during high temperature storage.
-
J.F.Rohan and G.O’Riordan, Microelectronic
Engineering, 65 (2003) 77-85. Characterisation of the electroless
nickel deposit as a barrier layer / under bump metallurgy on IC
metallisation.
-
J.F.Rohan, G.O’Riordan and J.Boardman, Applied
Surface Science, 185 (2002) 289. Selective electroless nickel
deposition on copper as a final barrier/bonding layer material for
microelectronics applications.
Contact: James Rohan – james.rohan@tyndall.ie | webpage
|