Fabrication:
Characterisation & Test:
- Microelectronic Device Electrical
Characterisation
Link
to Device Characterisation
- IC-level Reverse Engineering
Link
to Design Technology Evaluation Group Equipment
List
- Photonic Device Output Measurements
Link
to Photonics Systems Group Facilities
- SEM/EDX, AFM, FTIR, Raman
Spectroscopy
Link
to SEM facilities
Link
to Semiconductor Analysis Equipment
- Ellipsometry, Deep Level Transient
Spectroscopy
Link
to High-k Materials for Future IC Technology Facilities
- Tensile. Shear, Compressive & Cyclic
Strength Tests
- TMA,TGA, DSC & DMTA
Link
to Thermomechanical Equipment
- Scanning Acoustic Microscopy, X-ray Imaging
- Decpasulation, Cross-Sectioning, etc.
- Package Seal & PIND Tests
Advanced
Magnetics Characterisation Facilities
Magnetics
Sensor Characterisation Facilities
|
Design, Modelling & Simulation:
Microelectronics & Photonics Packaging:
-
Wafer Dicing
-
Die-attach / Chip Bonding
-
Ink jet Solder Paste/ Epoxy Dispense
-
Au and Al Wire Bonding
-
Hermetic Sealing (Ceramic & Metal Packages)
-
Chip-on-Board (COB) / Chip & Wire Assembly
-
Adhesive & Solder Flip-Chip Assembly
-
Epoxy Glob-top Encapsulation
-
Solder Paste / Adhesive Screen Print
-
Component Pick & Place
-
-
Air-to-air Thermal Shock, Thermal Cycling
-
Temperature Humidity Bias (THB) Testing
-
Highly Accelerated Stress Test (HAST)
-
High & Low Temperature Storage / Endurance
-
Random Frequency & Swept Sinusoidal Vibration
-
Mechanical Shock Testing
-
|