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a programme of the Tyndall National Institute with funding from SFI

Facilities available: Tyndall Packaging Capabilities
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Introduction
The Tyndall Interconnection & Packaging Laboratory offers facilities for the development of assembly processes and the packaging of prototype microelectronics, microsystems and photonics devices.  The capabilities on offer are summarised below and are available to researchers in third level institutions throughout Ireland under the National Access Programme (NAP). The facilities are also available on request to technology development companies in Ireland and worldwide.

 

Tyndall Low-Volume Packaging Processes:

  • Hermetic ceramic package assembly.
  • Hybrid circuit & Multi-Chip Module (MCM) assembly.
  • Chip-on-Board (CoB) assembly.
  • Optoelectronic / photonics packaging.
  • Flexible Circuit Fabrication.


Chip-on-Board packaging for sensors

Semiconductor Thinning, Lapping & Polishing:

  • Semiconductor thinning to 100µm (part wafers / pieces) only.
  • Normal , 8° & 45° facets polish.
  • Polymer & silica recipes.
  • Typical surface roughness  = 20-30nm


Logitech wafer grinding / polishing system

Wafer Dicing:

  • Fully automated DISCO Hi-Tec DAD3350 saw.
  • Up to 8'' (150mm) wafers.
  • Die sizes from 1.0mm x 1.0mm.
  • Angled facets possible.
  • Accuracy <+- 3um.
  • Wafer thicknesses up to 700um.
  • Range of wafer materials (Si, GaAs, glass, sapphire, etc) handled.

 
DISCO Hi Tec DAD3350 dicing saw

Dispense Capabilities:
  • Automated epoxy dispense.
  • Die-attach (conductive or non-conductive adhesive).
  • Glob top encapsulation for chip-on-board.
  • High accuracy “dam & fill” encapsulation
  • Selective encapsulation for sensor devices.
  • Flip-chip under fill.
  • High accuracy ink-jet dispense for polymers & solders.


Newport ink-jet dispense system

Wire Bond Facilities:

  • 25um Al-wire wedge bonding

  • 25um Au-wire ball bonding

  • Au ribbon bonding

  • 300 µm  Al wire bonding for power packaging applications

  • Royce micro-tester for bond strength measurement to Mil-Std-883F, Method 2011.7.


Au Ribbon Bonder

Flip-Chip Bonding Facilities:

  • Solder (C4) & adhesive (e.g. conductive adhesive, ACA film, etc.) bonding.

  • Placement accuracy to ­­± 1.0µm.

  • Bonding process temperature up to 400şC.

  • Bonding force from 200g to 20kg.

  • Planarity control.

  • Ultrasonic & thermosonic bonding possible.

  • Inert gas bonding atmosphere possible.

  • Under fill dispense & cure for enhanced strength & reliability.


RD Automation – M8-AN Flip-Chip Bonder

Hermetic Sealing:

  • Metal & ceramic packages (TO cans, DIL, CERDIP, CPGA, CQFP, etc.).

  • Solder & glass reflow lid-sealing (process temp = up to 450şC).

  • Inert atmosphere (e.g. nitrogen) sealing possible.

  • Vacuum sealing possible.

  • Helium fine leak test (Veeco MS18AB) to Mil-Std-883F, Method 1014.11, Cond. A1.

  • Perfluorocarbon gross leak test (Trio-Tech) to Mil-Std-883F, Method 1014.11, Cond. C1.

  • Particle Impact Noise Detection (PIND) test to Mil-Std-883F, Method 2020.8, Cond. A.


Reflow system for hermetic package sealing

Optoelectronic / Photonics Packaging Capabilities:

Laser Weld System:
         Assembly of “butterfly” packages
         2-beam or 3-beam configurations.
         Adaptable to other package types.

Fibre / Planar Device Alignment & Bonding:
         50nm positional accuracy.
Automated alignment & bonding of active optical devices.


Tyndall’s fibre / planar device alignment & bonding system

Packaging for Power Devices:

  • Assembly on metallised ceramic substrates or power packages.

  • Solder die attach  / solder flip chip.

  • 300 µm Aluminium wire bonding.

  • IR thermal imaging.

  • Thermal resistance (Rθjc) measurement.


Power converter on ceramic substrate

Packaging Test, Analysis & Quality Evaluation Capabilities:  

  • High magnification optical & SEM inspection.

  • X-ray imaging (real time & high resolution film).

  • Scanning Acoustic Microscopy Imaging.

  • Bond pull & die shear tests for wire bond, flip-chip & die-attach evaluation.

  • Fine & gross leak tests for seal quality evaluation.

  • PIND (Particle impact noise detection) test for cavity packages.

  • Multicore MUST wetting balance solderability test.

  • Microsectioning (encapsulated cross-section prepared to 1µm polished finish).

  • Chemical decapsulation (for removal of plastic moulding compounds).

  • Materials & contaminant analysis (EDX, FTIR & Raman).


Wire bond inspection using SEM


X-ray image of micro power converter

For further details contact:

For further details, please contact either of the following:

Mr. Finbarr Waldron                           Tel:  + 353 (0)21 490 4093                    E-mail: finbarr.waldron@tyndall.ie

Mr. Ken Rodgers                                  Tel: + 353 (0)21 490 4226                        E-mail: ken.rodgers@tyndall.ie

Ref: www.tyndall.ie/nap/packaging.html

Programme Coordinator: Paul Roseingrave | Telephone: +353 (0)21 490 4268 | Email: nap@tyndall.ie

 

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