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Tyndall
Low-Volume Packaging Processes:
- Hermetic
ceramic package assembly.
- Hybrid
circuit & Multi-Chip Module (MCM) assembly.
- Chip-on-Board
(CoB) assembly.
- Optoelectronic
/ photonics packaging.
- Flexible
Circuit Fabrication.
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Chip-on-Board
packaging for sensors
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Semiconductor
Thinning, Lapping & Polishing:
- Semiconductor
thinning to 100µm (part wafers / pieces) only.
- Normal
,
8° & 45° facets polish.
- Polymer
& silica recipes.
- Typical
surface roughness =
20-30nm
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Logitech
wafer grinding / polishing system
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Wafer
Dicing:
- Fully automated
DISCO Hi-Tec DAD3350 saw.
- Up to 8'' (150mm)
wafers.
- Die sizes from
1.0mm x 1.0mm.
- Angled facets
possible.
- Accuracy <+-
3um.
- Wafer thicknesses
up to 700um.
- Range
of wafer materials (Si,
GaAs,
glass, sapphire, etc) handled.
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DISCO
Hi Tec DAD3350 dicing saw |
Dispense
Capabilities:
- Automated
epoxy dispense.
- Die-attach
(conductive or non-conductive adhesive).
- Glob top
encapsulation for chip-on-board.
- High accuracy
“dam & fill” encapsulation
- Selective
encapsulation for sensor devices.
- Flip-chip under
fill.
- High accuracy ink-jet dispense for polymers & solders.
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Newport
ink-jet dispense system
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Wire
Bond Facilities:
-
25um Al-wire wedge bonding
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25um Au-wire ball bonding
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Au ribbon bonding
-
300 µm Al
wire bonding for power packaging applications
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Royce
micro-tester for bond strength measurement to
Mil-Std-883F, Method 2011.7.
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Au
Ribbon Bonder
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Flip-Chip
Bonding Facilities:
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Solder (C4) & adhesive (e.g.
conductive adhesive, ACA film, etc.) bonding.
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Placement accuracy to ± 1.0µm.
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Bonding process temperature up to 400şC.
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Bonding force from 200g to 20kg.
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Planarity control.
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Ultrasonic & thermosonic bonding
possible.
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Inert gas bonding atmosphere possible.
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Under
fill dispense & cure for enhanced strength &
reliability.
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RD Automation – M8-AN Flip-Chip Bonder
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Hermetic
Sealing:
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Metal & ceramic packages (TO cans,
DIL, CERDIP, CPGA, CQFP, etc.).
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Solder & glass reflow lid-sealing
(process temp = up to 450şC).
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Inert atmosphere (e.g. nitrogen) sealing
possible.
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Vacuum sealing possible.
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Helium fine leak test (Veeco MS18AB) to
Mil-Std-883F, Method 1014.11, Cond. A1.
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Perfluorocarbon gross leak test
(Trio-Tech) to Mil-Std-883F, Method 1014.11, Cond. C1.
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Particle
Impact Noise Detection (PIND) test to Mil-Std-883F,
Method 2020.8, Cond. A.
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Reflow system for hermetic package sealing
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Optoelectronic
/ Photonics Packaging Capabilities:
Laser
Weld System:
•
Assembly of “butterfly” packages
•
2-beam or 3-beam configurations.
•
Adaptable to other package types.
Fibre
/ Planar Device
Alignment
& Bonding:
•
50nm positional accuracy.
Automated
alignment & bonding of active optical devices.
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Tyndall’s fibre / planar device alignment & bonding system
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Packaging
for Power Devices:
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Assembly on metallised ceramic
substrates or power packages.
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Solder die attach
/ solder flip chip.
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300 µm Aluminium wire bonding.
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IR thermal imaging.
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Thermal
resistance (Rθjc) measurement.
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Power converter on ceramic substrate
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Packaging
Test, Analysis & Quality Evaluation Capabilities:
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High
magnification optical & SEM inspection.
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X-ray
imaging (real time & high resolution film).
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Scanning Acoustic Microscopy Imaging.
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Bond pull & die shear tests for wire
bond, flip-chip & die-attach evaluation.
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Fine & gross leak tests for seal
quality evaluation.
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PIND (Particle impact noise detection)
test for cavity packages.
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Multicore MUST wetting balance
solderability test.
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Microsectioning
(encapsulated cross-section prepared to 1µm polished
finish).
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Chemical decapsulation (for removal of
plastic moulding compounds).
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Materials
& contaminant analysis (EDX, FTIR & Raman).
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Wire
bond inspection using SEM
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X-ray
image of micro power converter
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For
further details contact:
For
further details, please contact either of the following:
Mr. Finbarr Waldron
Tel: + 353 (0)21 490 4093
E-mail: finbarr.waldron@tyndall.ie
Mr. Ken Rodgers
Tel: + 353 (0)21 490 4226
E-mail: ken.rodgers@tyndall.ie
Ref:
www.tyndall.ie/nap/packaging.html
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