Block copolymer lithography: feature size control and extension by an over-etch
Publication type:
Peer-reviewed journal article
Authors(Internal):
All authors:
[Senthamaraikannan, Ramsankar],[Rasappa Sozaraj],[Faulkner, Colm],[Gleeson, Peter]
Theme:
Nanoelectronics
Abstract:
Block copolymer lithography based on block copolymer (BCP) self-assembly can be used to develop soft mask nanoscale templates for subsequent pattern transfer to generate substrate features. Self-assembly of lamellar polystyrene-b-polymethylmethacrylate BCP of varying molecular weights to generate silicon nanoscale features is reported here. It has also been demonstrated that the feature size can be controlled by a plasma over-etch process and discussed.
Tags:
Block copolymers
Lithgraphy
Etch
Date accepted:
05/09/2012
Publication date:
17/12/2012
Funder:
EU FP7 NMP project, LAMAND (grant number 245565) project and the Science Foundation Ireland
Journal abbreviation:
THIN SOLID FILMS
Journal/Book title:
Thin Solid Films
Volume:
522
Page start:
318
Page end:
323
URI:
http://dx.doi.org/10.1016/j.tsf.2012.09.017
Year:
2013
Document Controller:
[Mick Morris][Justin Holmes][Dipu Borah][Matthew Shaw]