Optical Characterisation Facilities

PicoQuant MicroTime 200 Scanning Confocal Fluorescence Microscope

A customised time-resolved scanning confocal fluorescence microscope for single nanostructure imaging, spectroscopy and fluorescence lifetime measurements.
System incorporates:

      -  Dual wavelength excitation (400 nm, 475 nm).
      -  Dual colour, dual polarisation detection.
      -  Thermoelectrically cooled camera and spectrograph
         for spatially resolved spectroscopic characterisation.
      -  Nanosecond fluorescence lifetime imaging measurements.

Thermomicroscopes Aurora II Near-field Scanning Optical Microscope (NSOM)

A modified NSOM system has been constructed incorporating:

      -  Dual wavelength excitation (400 nm, 488 nm).
      -  Dual colour, dual polarisation detection. 
      -  Liquid nitrogen cooled camera and spectrograph for 
         spatially resolved spectroscopic characterisation.

 

Photoluminescence System 

Versatile photo/electro-luminescence system with polarisation control for characterisation of solution-, film-, waveguide- and OLED-devices. System incorporates:

      -  Multi-wavelength argon ion laser source (350 nm -514 nm).
      -  Nanosecond Nd:YVO4 pulsed laser & harmonic generators 
        (266 nm, 355 nm, 532 nm, 1064 nm).
      -  Triax 190 monochromator.
      -  Hamamatsu R928 photomultiplier tube.
      -  High-resolution liquid nitrogen-cooled germanium detector.
      -  Integrating sphere.

 

 

Agilent 8453 UV/Visible Spectrophotometer

High sensitivity, fast-scanning diode array spectrometer with Peltier thermostatted cell holder. 

        - Wavelength range: 190 - 1100 nm.
        - Spectral resolution: < 2 nm. 
        - Less than 0.03 % stray light.

 

Electro-optical Characterisation Setup 

Versatile computer-controlled electro-optical characterisation setup  for simultaneous current-voltage-luminescence measurements on organic devices at visible and infra-red wavelengths. Measurements can be performed in situ using the electro-optical test station in the MBraun inert atmosphere glovebox.

 

  -  Keithley 2400 & 2410 sourcemeters for electrical characterisation.


  -  HP 4156A or 4157B  parameter analysers for low-noise
     measurements.


  -  Newport 1835C multi-function optical meter interfaced to in situ
      calibrated low-power photodetectors:

          -  Silicon photodetector for measurements at visible and

              near infra-red wavelengths (400 nm - 1100 nm).
             
          -  Germanium photodetector for measurements at
              infra-red wavelengths (780 - 1800 nm).



 

 

 

Zeiss Axioskop 2 Epifluoresence Microscope 

Research grade microscope for white light and epifluorescence imaging (resolution ~ 1 µm).

 

      -  Magnification: 2.5X, 10X, 50X, 100X.

      -  Multiple filter sets for excitation at 400, 488, 546, 578 nm.

      -  Image acquisition: Optronics DEI-750 CCD.

 

 

 

 

 

 

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