Dr Brendan Sheehan is a Software Engineer for the automation of electrical testing of on-wafer devices at Tyndall National Institute. Since he joined in 2013, he has participated in numerous EU and National projects in the areas of electrical test and measurement and material characterization.
His current work focuses on sub-10nm device forensics, utilizing techniques such as Atomic Force Microscopy and electron beam microscopy (SEM/FIB/TEM) to investigate nano-electrical and nano-mechanical material properties.
He received his B.Sc. degree in Experimental Physics and his Ph.D. degree in Astronomical Instrumentation from University Galway, Ireland, in 2004 and 2009, respectively. He continued in this field of study as a Postdoctoral Researcher until 2011, where he worked with a team on the development of a photon-counting system for an optical imaging polarimeter.
Experience
Brendan’s expertise spans three key areas: physical characterization, electrical testing, and measurement automation. As a member of the Professional Support Staff, he engages with a diverse array of materials and devices from both academic researchers and external clients.
This exposure has equipped him with a wide range of experience in handling various sample types and analysis requests. A primary focus of Brendan’s work is the ongoing development of sample preparation techniques for physical and material characterization. He collaborates with EU project partners to deliver analysis protocols and actively maintains close relationships with tool vendors, ensuring that Tyndall researchers have access to the latest characterisation techniques.
Additionally, as a NI Certified LabVIEW Developer, Brendan supports scientific staff and students in measurement automation across numerous projects.
Professional Activities
Brendan is actively involved in teaching and instrument training within the area of device and material characterisation. He regularly conducts training sessions on LabVIEW, data processing of Atomic Force Microscopy (AFM) data—covering topography, electrical, and mechanical properties—and device forensics. To assist in this endeavour, Brendan organises yearly workshops on Atomic Force Microscopy to advance the in-house techniques available to Tyndall researchers. He also regularly plays a supporting role in the teaching of undergraduate students and providing guidance in conducting lab experiments and reporting.
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