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Leader in Integrated ICT Hardware & Systems

Mircea Modreanu - Staff Researcher

Mircea Gabriel Modreanu

Contact

+353 (0)21 2346267
mircea.modreanu (at) tyndall (dot) ie

  • MNS (Materials and Devices)

1993 - Master of Science degree in Atomic and Molecular Physics from Faculty of Physics, University of Bucharest.

2001 –Ph.D.degree in Condensed Physics Matter (Magna cum Laude), from University of Bucharest. The thesis is dedicated to the theoretical and experimental study of deposition kinetics, optical,electrical and structural properties of amorphous and crystalline silicon, silicon nitride, silicon oxynitride and silicon-rich nitride and doped and undoped SiO2 CVD thin films.

  • Functional metal oxides:
  • -dielectrics (high k materials, tunable refractive index materials)
  • -semiconductors (n-type TCOs, p-type TCOs)
  • Advanced optical spectroscopy of thin films and their interfaces:
  • -amorphous to crystalline phase transition
  • -interfacial properties
  • -optical properties ( UV down to Far IR spectral range)
  • -vibrational properties (IR and Raman)
  • -spectroscopic ellipsometry
  • -optical spectrophotometry
  • -surface and tip enhanced IR and Raman spectrocopy
  •  Transparent electronics
  • Virtual substrates for novel optoelectronic devices and for high efficiency solar cells
  • Integration of III-V materials on Si

Research Grants

  • Carbon Based Smart Systems For wireless applications. (European Framework Programme Seven (FP7)) €290,000.00 (03-SEP-12 / 08-SEP-15)

Books

YearPublication

Peer Reviewed Journals

YearPublication

Other Journals

YearPublication
2014 Effect of nitrogen incorporation on the structural, optical and dielectric properties of reactive sputter grown ITO films
Gartner, M. and Stroescu, H. and Marin, A. and Osiceanu, P. and Anastasescu, M. and Stoica, M. and Nicolescu, M. and Duta, M. and Preda, S. and Aperathitis, E. and Pantazis, A. and Kampylafka, V. and Modreanu, M. and Zaharescu, M (2014) Effect of nitrogen incorporation on the structural, optical and dielectric properties of reactive sputter grown ITO films. : Applied Surface Science. [Details]
2014 Carboxyl functionalised MWCNT/polymethyl methacrylate bone cement for orthopaedic applications
Ormsby, R.W. and Modreanu, M. and Mitchell, C.A. and Dunne, N.J (2014) Carboxyl functionalised MWCNT/polymethyl methacrylate bone cement for orthopaedic applications. : Journal of Biomaterials Applications. [Details]
2013 Electron scattering mechanisms in fluorine-doped SnO2 thin films
Rey, G. and Ternon, C. and Modreanu, M. and Mescot, X. and Consonni, V. and Bellet, D (2013) Electron scattering mechanisms in fluorine-doped SnO2 thin films. : Journal of Applied Physics. [Details]
2013 Structural and luminescence properties of HfO2 nanocrystals grown by atomic layer deposition on SiC/SiO2 core/shell nanowires
Rossi, F. and Fabbri, F. and Tallarida, M. and Schmeisser, D. and Modreanu, M. and Attolini, G. and Salviati, G (2013) Structural and luminescence properties of HfO2 nanocrystals grown by atomic layer deposition on SiC/SiO2 core/shell nanowires. : Scripta Materialia. [Details]
2013 Influence of thermal treatment in N2 atmosphere on chemical, microstructural and optical properties of indium tin oxide and nitrogen doped indium tin oxide rf-sputtered thin films
Stroescu, H. and Anastasescu, M. and Preda, S. and Nicolescu, M. and Stoica, M. and Stefan, N. and Kampylafka, V. and Aperathitis, E. and Modreanu, M. and Zaharescu, M. and Gartner, M (2013) Influence of thermal treatment in N2 atmosphere on chemical, microstructural and optical properties of indium tin oxide and nitrogen doped indium tin oxide rf-sputtered thin films. : Thin Solid Films. [Details]
2013 Vibrational properties of SrCu2O2 studied via Density Functional Theory calculations and compared to Raman and infrared spectroscopy measurements
Even, J. and Pedesseau, L. and Durand, O. and Modreanu, M. and Huyberechts, G. and Servet, B. and Chaix-Pluchery, O (2013) Vibrational properties of SrCu2O2 studied via Density Functional Theory calculations and compared to Raman and infrared spectroscopy measurements. : Thin Solid Films. [Details]
2013 Special issue on current Trends in Optical and X-Ray Metrology of Advanced Materials for Nanoscale Devices III, E-MRS Spring 2012 - Symposium W, held in Strasbourg, France, May 14-18, 2012
Modreanu, M. and Durand, O. and Jellison, G.E. and Salviati, G. and Fried, M (2013) Special issue on current Trends in Optical and X-Ray Metrology of Advanced Materials for Nanoscale Devices III, E-MRS Spring 2012 - Symposium W, held in Strasbourg, France, May 14-18, 2012. : Thin Solid Films. [Details]
2012 Optimisation and scaling of interfacial GeO 2 layers for high-¿ gate stacks on germanium and extraction of dielectric constant of GeO 2
Murad, S.N.A. and Baine, P.T. and McNeill, D.W. and Mitchell, S.J.N. and Armstrong, B.M. and Modreanu, M. and Hughes, G. and Chellappan, R.K (2012) Optimisation and scaling of interfacial GeO 2 layers for high-¿ gate stacks on germanium and extraction of dielectric constant of GeO 2. : Solid-State Electronics. [Details]
2012 Influence of the substrate and nitrogen amount on the microstructural and optical properties of thin r.f.-sputtered ZnO films treated by rapid thermal annealing
Nicolescu, M. and Anastasescu, M. and Preda, S. and Stroescu, H. and Stoica, M. and Teodorescu, V.S. and Aperathitis, E. and Kampylafka, V. and Modreanu, M. and Zaharescu, M. and Gartner, M (2012) Influence of the substrate and nitrogen amount on the microstructural and optical properties of thin r.f.-sputtered ZnO films treated by rapid thermal annealing. : Applied Surface Science. [Details]
2011 Transparent p/n diode device from a single zinc nitride sputtering target
Kambilafka, V. and Kostopoulos, A. and Androulidaki, M. and Tsagaraki, K. and Modreanu, M. and Aperathitis, E (2011) Transparent p/n diode device from a single zinc nitride sputtering target. : Thin Solid Films. [Details]
2011 Raman spectroscopic monitoring of the osteogenic differentiation of human mesenchymal stem cells
McManus, L.L. and Burke, G.A. and McCafferty, M.M. and O'Hare, P. and Modreanu, M. and Boyd, A.R. and Meenan, B.J (2011) Raman spectroscopic monitoring of the osteogenic differentiation of human mesenchymal stem cells. : Analyst. [Details]
2008 Growth and characterisation of CaCu2Ox thin films by pulsed injection MOCVD
Deschanvres, J.L. and Jimenez, C. and Rapenne, L. and McSporran, N. and Servet, B. and Durand, O. and Modreanu, M (2008) Growth and characterisation of CaCu2Ox thin films by pulsed injection MOCVD. : Thin Solid Films. [Details]
2007 Extraction of the refractive index profile of thin transparent conductive oxide films from the analysis of reflectance optical spectra
Kondilis, A. and Aperathitis, E. and Modreanu, M (2007) Extraction of the refractive index profile of thin transparent conductive oxide films from the analysis of reflectance optical spectra. : Thin Solid Films. [Details]
2007 Optical and microstructural properties of p-type SrCu2O2: First principles modeling and experimental studies
Modreanu, M. and Nolan, M. and Elliott, S.D. and Durand, O. and Servet, B. and Garry, G. and Gehan, H. and Huyberechts, G. and Papadopoulou, E.L. and Androulidaki, M. and Aperathitis, E (2007) Optical and microstructural properties of p-type SrCu2O2: First principles modeling and experimental studies. : Thin Solid Films. [Details]
2007 Study of the growth conditions and characterization of CaCu2Ox and SrCu2Ox thin films
Millon, C. and Deschanvres, J.L. and Jiménez, C. and Macsporran, N. and Servet, B. and Durand, O. and Modreanu, M (2007) Study of the growth conditions and characterization of CaCu2Ox and SrCu2Ox thin films. : Surface and Coatings Technology. [Details]
2007 Studies of oxide-based thin-layered heterostructures by X-ray scattering methods
Durand, O. and Rogers, D. and Teherani, F.H. and Andrieux, M. and Modreanu, M (2007) Studies of oxide-based thin-layered heterostructures by X-ray scattering methods. : Thin Solid Films. [Details]
2006 Thin multilayers characterization by grazing X-ray reflectometry and use of Fourier transform
Bridou, F. and Gautier, J. and Delmotte, F. and Ravet, M.-F. and Durand, O. and Modreanu, M (2006) Thin multilayers characterization by grazing X-ray reflectometry and use of Fourier transform. : Applied Surface Science. [Details]
2006 Stabilization of the anatase phase in TiO2(Fe3+, PEG) nanostructured coatings
Trapalis, C. and Gartner, M. and Modreanu, M. and Kordas, G. and Anastasescu, M. and Scurtu, R. and Zaharescu, M (2006) Stabilization of the anatase phase in TiO2(Fe3+, PEG) nanostructured coatings. : Applied Surface Science. [Details]
2010 Properties of strontium copper oxide (SCO) deposited by PLD using the 308nm laser and formation of SCO/Si heterostructures
Louloudakis, D. and Varda, M. and Papadopoulou, E.L. and Kayambaki, M. and Tsagaraki, K. and Kambilafka, V. and Modreanu, M. and Huyberechts, G. and Aperathitis, E (2010) Properties of strontium copper oxide (SCO) deposited by PLD using the 308nm laser and formation of SCO/Si heterostructures. : Physica Status Solidi (A) Applications and Materials Science. [Details]
2010 Surface topography and optical properties of nitrogen doped ZnO thin films formed by radio frequency magnetron sputtering on fused silica substrates
Nicolescu, M. and Anastasescu, M. and Preda, S. and Calderon-Moreno, J.M. and Stroescu, H. and Gartner, M. and Teodorescu, V.S. and Maraloiu, A.V. and Kampylafka, V. and Aperathitis, E. and Modreanu, M (2010) Surface topography and optical properties of nitrogen doped ZnO thin films formed by radio frequency magnetron sputtering on fused silica substrates. : Journal of Optoelectronics and Advanced Materials. [Details]
2010 Investigation of microstructural properties of nitrogen doped ZnO thin films formed by magnetron sputtering on silicon substrate
Nicolescu, M. and Anastasescu, M. and Preda, S. and Calderon-Moreno, J.M. and Osiceanu, P. and Gartner, M. and Teodorescu, V.S. and Maraloiu, A.V. and Kampylafka, V. and Aperathitis, E. and Modreanu, M (2010) Investigation of microstructural properties of nitrogen doped ZnO thin films formed by magnetron sputtering on silicon substrate. : Journal of Optoelectronics and Advanced Materials. [Details]
2009 Properties of n-type ZnN thin films as channel for transparent thin film transistors
Aperathitis, E. and Kambilafka, V. and Modreanu, M (2009) Properties of n-type ZnN thin films as channel for transparent thin film transistors. : Thin Solid Films. [Details]
2009 Optical spectroscopy study of nc-Si-based p-i-n solar cells
Sancho-Parramon, J. and Gracin, D. and Modreanu, M. and Gajovic, A (2009) Optical spectroscopy study of nc-Si-based p-i-n solar cells. : Solar Energy Materials and Solar Cells. [Details]
2009 Effect of annealing on the properties of indium-tin-oxynitride films as ohmic contacts for GaN-based optoelectronic devices
Himmerlich, M. and Koufaki, M. and Ecke, G. and Mauder, C. and Cimalla, V. and Schaefer, J.A. and Kondilis, A. and Pelekanos, N.T. and Modreanu, M. and Krischok, S. and Aperathitis, E (2009) Effect of annealing on the properties of indium-tin-oxynitride films as ohmic contacts for GaN-based optoelectronic devices. : ACS Applied Materials and Interfaces. [Details]
2008 Electrical, structural, and chemical properties of HfO2 films formed by electron beam evaporation
Cherkaoui, K. and Monaghan, S. and Negara, M.A. and Modreanu, M. and Hurley, P.K. and O'Connell, D. and McDonnell, S. and Hughes, G. and Wright, S. and Barklie, R.C. and Bailey, P. and Noakes, T.C.Q (2008) Electrical, structural, and chemical properties of HfO2 films formed by electron beam evaporation. : Journal of Applied Physics. [Details]
2008 Optical characterization of HfO2 by spectroscopic ellipsometry: Dispersion models and direct data inversion
Sancho-Parramon, J. and Modreanu, M. and Bosch, S. and Stchakovsky, M (2008) Optical characterization of HfO2 by spectroscopic ellipsometry: Dispersion models and direct data inversion. : Thin Solid Films. [Details]
2008 Derivation of the complex refractive index of ITO and ITON films in the infrared region of the spectrum by the analysis of optical measurements
Kondilis, A. and Aperathitis, E. and Modreanu, M (2008) Derivation of the complex refractive index of ITO and ITON films in the infrared region of the spectrum by the analysis of optical measurements. : Thin Solid Films. [Details]
2008 Effect of chlorine doping on electrical and optical properties of ZnO thin films
Chikoidze, E. and Nolan, M. and Modreanu, M. and Sallet, V. and Galtier, P (2008) Effect of chlorine doping on electrical and optical properties of ZnO thin films. : Thin Solid Films. [Details]
2008 Study of the growth and annealing conditions of SrCu 2O 2 (SCO) thin films deposited by injection MOCVD
Deschanvres, J.L. and Millon, C. and Jimenez, C. and Khan, A. and Roussel, H. and Servet, B. and Durand, O. and Modreanu, M (2008) Study of the growth and annealing conditions of SrCu 2O 2 (SCO) thin films deposited by injection MOCVD. : Physica Status Solidi (A) Applications and Materials Science. [Details]
2008 Electrical properties of chlorine-doped ZnO thin films grown by MOCVD
Chikoidze, E. and Modreanu, M. and Sallet, V. and Gorochov, O. and Galtier, P (2008) Electrical properties of chlorine-doped ZnO thin films grown by MOCVD. : Physica Status Solidi (A) Applications and Materials Science. [Details]
2005 LPCVD-silicon oxynitride films: Interface properties
Halova, E. and Alexandrova, S. and Szekeres, A. and Modreanu, M (2005) LPCVD-silicon oxynitride films: Interface properties. : Microelectronics Reliability. [Details]
2005 Post deposition UV-induced O2 annealing of HfO2 thin films
Fang, Q. and Liaw, I. and Modreanu, M. and Hurley, P.K. and Boyd, I.W (2005) Post deposition UV-induced O2 annealing of HfO2 thin films. : Microelectronics Reliability. [Details]
2005 Solid phase crystallisation of HfO2 thin films
Modreanu, M. and Sancho-Parramon, J. and O'Connell, D. and Justice, J. and Durand, O. and Servet, B (2005) Solid phase crystallisation of HfO2 thin films. : Materials Science and Engineering B: Solid-State Materials for Advanced Technology. [Details]
2005 Characterisation of room temperature blue emmiting Si/SiO2 multilayers
Modreanu, M. and Aperathitis, E. and Androulidaki, M. and Audier, M. and Chaix-Pluchery, O (2005) Characterisation of room temperature blue emmiting Si/SiO2 multilayers. : Optical Materials. [Details]
2005 The influence of Cu on the morphological and chemical properties of nanostructured TiO2 films
Gartner, M. and Ghita, A. and Anastasescu, M. and Osiceanu, P. and Dobrescu, G. and Zaharescu, M. and Macovei, D. and Modreanu, M. and Trapalis, C. and Kordas, G (2005) The influence of Cu on the morphological and chemical properties of nanostructured TiO2 films. : Journal of Optoelectronics and Advanced Materials. [Details]
2004 Spectroellipsometric characterization of sol-gel TiO2-CuO thin coatings
Gartner, M. and Scurtu, R. and Ghita, A. and Zaharescu, M. and Modreanu, M. and Trapalis, C. and Kokkoris, M. and Kordas, G (2004) Spectroellipsometric characterization of sol-gel TiO2-CuO thin coatings. : Thin Solid Films. [Details]
2004 Interface of ultrathin HfO2 films deposited by UV-photo-CVD
Fang, Q. and Zhang, J.-Y. and Wang, Z. and Modreanu, M. and O'Sullivan, B.J. and Hurley, P.K. and Leedham, T.L. and Hywel, D. and Audier, M.A. and Jimenez, C. and Senateur, J.-P. and Boyd, I.W (2004) Interface of ultrathin HfO2 films deposited by UV-photo-CVD. : Thin Solid Films. [Details]
2006 Optical emission spectroscopy during fabrication of indium-tin-oxynitride films by RF-sputtering
Koufaki, M. and Sifakis, M. and Iliopoulos, E. and Pelekanos, N. and Modreanu, M. and Cimalla, V. and Ecke, G. and Aperathitis, E (2006) Optical emission spectroscopy during fabrication of indium-tin-oxynitride films by RF-sputtering. : Applied Surface Science. [Details]
2006 Optical characterization and microstructure of BaTiO3 thin films obtained by RF-magnetron sputtering
Ianculescu, A. and Gartner, M. and Despax, B. and Bley, V. and Lebey, Th. and Gavrila, R. and Modreanu, M (2006) Optical characterization and microstructure of BaTiO3 thin films obtained by RF-magnetron sputtering. : Applied Surface Science. [Details]
2006 Investigation of thermal annealing effects on microstructural and optical properties of HfO2 thin films
Modreanu, M. and Sancho-Parramon, J. and Durand, O. and Servet, B. and Stchakovsky, M. and Eypert, C. and Naudin, C. and Knowles, A. and Bridou, F. and Ravet, M.-F (2006) Investigation of thermal annealing effects on microstructural and optical properties of HfO2 thin films. : Applied Surface Science. [Details]
2006 Optical characterization of InxGa1-xN alloys
Gartner, M. and Kruse, C. and Modreanu, M. and Tausendfreund, A. and Roder, C. and Hommel, D (2006) Optical characterization of InxGa1-xN alloys. : Applied Surface Science. [Details]
2006 Characterization of Ge-on-Si virtual substrates and single junction GaAs solar cells
Ginige, R. and Corbett, B. and Modreanu, M. and Barrett, C. and Hilgarth, J. and Isella, G. and Chrastina, D. and Von Känel, H (2006) Characterization of Ge-on-Si virtual substrates and single junction GaAs solar cells. : Semiconductor Science and Technology. [Details]
2005 Electrical characterization of HfO2 films obtained by UV assisted injection MOCVD
Decams, J.M. and Guillon, H. and Jiménez, C. and Audier, M. and Sénateur, J.P. and Dubourdieu, C. and Cadix, O. and O'Sullivan, B.J. and Modreanu, M. and Hurley, P.K. and Rusworth, S. and Leedham, T.J. and Davies, H. and Fang, Q. and Boyd, I (2005) Electrical characterization of HfO2 films obtained by UV assisted injection MOCVD. : Microelectronics Reliability. [Details]
2002 The etching behavior of APCVD PSG thin films used as sacrificial layers for surface micromachined resonant microstructures
Modreanu, M. and Moldovan, C. and Iosub, R (2002) The etching behavior of APCVD PSG thin films used as sacrificial layers for surface micromachined resonant microstructures. : Sensors and Actuators, A: Physical. [Details]
2002 Micromachining of a silicon multichannel microprobe for neural electrical activity recording
Moldovan, C. and Ilian, V. and Constantin, Ghe. and Iosub, R. and Modreanu, M. and Dinoiu, I. and Firtat, B. and Voitincu, C (2002) Micromachining of a silicon multichannel microprobe for neural electrical activity recording. : Sensors and Actuators, A: Physical. [Details]
2004 X-Ray reflectivity and spectroscopic ellipsometry as metrology tools for the characterization of interfacial layers in high-¿ materials
Ferrari, S. and Modreanu, M. and Scarel, G. and Fanciulli, M (2004) X-Ray reflectivity and spectroscopic ellipsometry as metrology tools for the characterization of interfacial layers in high-¿ materials. : Thin Solid Films. [Details]
2004 Optical properties of silicon thin films related to LPCVD growth condition
Modreanu, M. and Gartner, M. and Cobianu, C. and O'Looney, B. and Murphy, F (2004) Optical properties of silicon thin films related to LPCVD growth condition. : Thin Solid Films. [Details]
2004 Thin Soild Films: Editorial
Modreanu, M. and Murtagh, M. and Ricote, J. and Chateigner, D. and Schreiber, J (2004) Thin Soild Films: Editorial. : Thin Solid Films. [Details]
2004 Photoreflectance spectroscopy study of vertical cavity surface emitting laser structures
Murtagh, M.E. and Guenebaut, V. and Ward, S. and Nee, D. and Kelly, P.V. and O'Looney, B. and Murphy, F. and Modreanu, M. and Westwater, S. and Blunt, R. and Bland, S.W (2004) Photoreflectance spectroscopy study of vertical cavity surface emitting laser structures. : Thin Solid Films. [Details]
2004 Optical characterization of indium-tin-oxynitride fabricated by RF-sputtering
Aperathitis, E. and Modreanu, M. and Bender, M. and Cimalla, V. and Ecke, G. and Androulidaki, M. and Pelekanos, N (2004) Optical characterization of indium-tin-oxynitride fabricated by RF-sputtering. : Thin Solid Films. [Details]
2003 Silicon micromachined sensor for gas detection
Moldovan, C. and Hinescu, L. and Hinescu, M. and Iosub, R. and Nisulescu, M. and Firtat, B. and Modreanu, M. and Dascalu, D. and Voicu, V. and Tarabasanu, C (2003) Silicon micromachined sensor for gas detection. : Materials Science and Engineering B: Solid-State Materials for Advanced Technology. [Details]
2003 Properties of rf-sputtered indium-tin-oxynitride thin films
Aperathitis, E. and Bender, M. and Cimalla, V. and Ecke, G. and Modreanu, M (2003) Properties of rf-sputtered indium-tin-oxynitride thin films. : Journal of Applied Physics. [Details]
2003 Investigation on preparation and physical properties of nanocrystalline Si/SiO2 superlattices for Si-based light-emitting devices
Modreanu, M. and Gartner, M. and Aperathitis, E. and Tomozeiu, N. and Androulidaki, M. and Cristea, D. and Hurley, P (2003) Investigation on preparation and physical properties of nanocrystalline Si/SiO2 superlattices for Si-based light-emitting devices. : Physica E: Low-Dimensional Systems and Nanostructures. [Details]
2002 LPCVD-silicon oxynitride films: Low-temperature annealing effects
Alexandrova, S. and Szekeres, A. and Halova, E. and Modreanu, M (2002) LPCVD-silicon oxynitride films: Low-temperature annealing effects. : User Modeling and User-Adapted Interaction. [Details]
2002 On the structure, morphology and electrical conductivities of titanium oxide thin films
Mardare, D. and Baban, C. and Gavrila, R. and Modreanu, M. and Rusu, G.I (2002) On the structure, morphology and electrical conductivities of titanium oxide thin films. : Surface Science. [Details]
2002 Microstructural information from optical properties of LPCVD silicon films annealed at low temperature
Gartner, M. and Modreanu, M. and Cobianu, C. and Gavrila, R. and Danila, M (2002) Microstructural information from optical properties of LPCVD silicon films annealed at low temperature. : Sensors and Actuators, A: Physical. [Details]
2002 Silicon membranes fabrication by wet anisotropic etching
Iosub, R. and Moldovan, C. and Modreanu, M (2002) Silicon membranes fabrication by wet anisotropic etching. : Sensors and Actuators, A: Physical. [Details]
2002 Investigation on preparation and physical properties of LPCVD SixOyNz thin films and nanocrystalline Si/SixOyNz superlattices for Si-based light emitting devices
Modreanu, M. and Gartner, M. and Cristea, D (2002) Investigation on preparation and physical properties of LPCVD SixOyNz thin films and nanocrystalline Si/SixOyNz superlattices for Si-based light emitting devices. : Materials Science and Engineering C. [Details]
2001 Elimination of silicon hillocks using an alkaline complexant etching system
Moldovan, C. and Iosub, R. and Modreanu, M (2001) Elimination of silicon hillocks using an alkaline complexant etching system. : International Journal of Inorganic Materials. [Details]
2001 Capacitance-Voltage Characterization of LPCVD-Silicon Oxynitride Films
Szekeres, A. and Alexandrova, S. and Modreanu, M (2001) Capacitance-Voltage Characterization of LPCVD-Silicon Oxynitride Films. : Physica Status Solidi (A) Applied Research. [Details]
2001 Photonic circuits integrated with CMOS compatible photodetectors
Cristea, D. and Craciunoiu, F. and Modreanu, M. and Caldararu, M. and Cernica, I (2001) Photonic circuits integrated with CMOS compatible photodetectors. : Optical Materials. [Details]
2001 Investigation on optical and microstructural properties of photoluminescent LPCVD SiOxNy thin films
Modreanu, M. and Gartner, M. and Tomozeiu, N. and Seekamp, J. and Cosmin, P (2001) Investigation on optical and microstructural properties of photoluminescent LPCVD SiOxNy thin films. : Optical Materials. [Details]
2001 Investigation on optical properties of CVD films used in MOEMS applications
Modreanu, M. and Gartner, M (2001) Investigation on optical properties of CVD films used in MOEMS applications. : Journal of Molecular Structure. [Details]
2001 Optical and electrical properties of LPCVD silicon oxynitride films on silicon
Szekeres, A. and Alexandrova, S. and Modreanu, M. and Cosmin, P. and Gartner, M (2001) Optical and electrical properties of LPCVD silicon oxynitride films on silicon. : Vacuum. [Details]
2001 Physical properties of polycrystalline silicon films related to LPCVD conditions
Modreanu, M. and Bercu, M. and Cobianu, C (2001) Physical properties of polycrystalline silicon films related to LPCVD conditions. : Thin Solid Films. [Details]
2001 Microstructural and optical properties of as-deposited LPCVD silicon films
Modreanu, M. and Tomozeiu, N. and Gartner, M. and Cosmin, P (2001) Microstructural and optical properties of as-deposited LPCVD silicon films. : Thin Solid Films. [Details]
1999 Optical characterization of dielectric borophosphosilicate glass
Gartner, M. and Modreanu, M. and Bosch, S. and Stoica, T (1999) Optical characterization of dielectric borophosphosilicate glass. : Microelectronics Reliability. [Details]
1999 Optical properties of LPCVD silicon oxynitride
Modreanu, M. and Tomozeiu, N. and Cosmin, P. and Gartner, M (1999) Optical properties of LPCVD silicon oxynitride. : Thin Solid Films. [Details]
2006 Characterization of Ge-on-Si virtual substrates and single junction GaAs solar cells
Ginige, R and Corbett, B and Modreanu, M and Barrett, C and Hilgarth, J and Isella, G and Chrastina, D and von K\"anel, H (2006) Characterization of Ge-on-Si virtual substrates and single junction GaAs solar cells. : Semiconductor science and technology. [Details]
2011 Investigation of bulk defects in amorphous and crystalline HfO< sub> 2
Modreanu, M and Monaghan, S and Povey, IM and Cherkaoui, K and Hurley, PK and Androulidaki, M (2011) Investigation of bulk defects in amorphous and crystalline HfO< sub> 2. : Microelectronic Engineering. [Details]
2007 Optical and microstructural properties of p-type SrCu< sub> 2
Modreanu, M and Nolan, M and Elliott, SD and Durand, O and Servet, B and Garry, G and Gehan, H and Huyberechts, G and Papadopoulou, EL and Androulidaki, M and others (2007) Optical and microstructural properties of p-type SrCu< sub> 2. : Thin Solid Films. [Details]

Conference Publications

YearPublication

Honours and Awards

  • 34th International Semiconductor Conference: Best Paper Award (2011)

Professional Associations

  • Board Member, European Material Research Society (14-MAY-12 / 01-JUN-15)

Employment

  • Senior Researcher, National Institute for Microtechnologies, IMT-Bucharest, Romania (01-SEP-93 / 20-JAN-02)

Education

  • University of Bucharest, Romania , MASTERS IN PHYSICS, Physics (1993)
  • University of Bucharest, Romania , Ph.D., Physics (2002)

Journal Activities

  • Guest Editor, Thin Solid Films (-)
  • Referee, Journal Of Physics D: Applied Physics (-)
  • Referee, Applied Physics Letters (-)
  • Referee, Appl Surf Sci (-)
  • Referee, Physical Chemistry Chemical Physics (-)
  • Referee, Analyst (-)
  • Referee, Crystengcomm (-)
  • Referee, Energy & Environmental Science (-)
  • Referee, Phys Status Solidi-R (-)
  • Referee, Opt Mater (-)
  • Referee, Chemphyschem (-)

External Collaborators

  • Dr. Guy Garry , Thales R&T (FRANCE )
  • Dr. G.E.Jellison , Oak Ridge National Laboratory (U.S.A. )
  • Dr. Carmen Jimenez , INPG-LMGP (FRANCE )
  • Dr Mariuca Gartner , Institul de Chimie Fizica I.G.Murgulescu al Academiei Romane (ROMANIA )
  • Prof. Yve Dumont , University of Versailles (FRANCE )
  • Dr. Bernard Servet , Thales R&T (FRANCE )
  • Dr. Afshin Ziaei , Thales R&T (FRANCE )
  • Prof. Olivier Durand , INSA Rennes (FRANCE )
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