The Electron Microscopy and Analysis Facility (EMAF) at Tyndall, is committed to deliver state-of-the-art electron microscopy characterisation with rapid turnaround time for Industry and Academia. We develop customer and product specific analysis of materials and devices and provide comprehensive understanding of the measurement results.
Thin oxide layer at an interfaceE. coli bacteria in cryo-SEM
Services:
Product contamination analysis
Thin film analysis (thickness + structure)
Failure analysis
Materials characterisation
Surface analysis
(S)TEM sample preparation
Trace analysis >10ppm
3D visualisation
Soft material cryo imaging (polymers and life science specimen (bio/food/pharma))
Correlative microscopy
FIB patterning/prototyping
Nanoparticle analysis
False coloured SEM image False coloured titanium signal of same image
Methods:
Scanning electron microscopy (SEM)
Elemental analysis (EDX)
(Scanning) transmission electron microscopy (S)TEM
Dual beam focused ion beam (FIB)
Electron diffraction (SAED)
Cryo SEM for soft materials
Contact enquiry (at) tyndall (dot) ie for all Business Development enquiries
