In conjunction with Tyndall National Institute, Bruker Nano-Surfaces will hold a workshop to demonstrate their latest developments in Atomic Force Microscopy on Wednesday 15th February, 2017. The goal of this workshop is to present the latest development in AFM modes for the high-resolution mapping of local Nano-mechanical, Nano-electrical and Nano-chemical properties of surfaces.
The workshop will include a seminar by Dr. Khizar Sheikh (Bruker Nano-Surfaces, UK) on the topics of Peak-Force Tapping and Fast-Scanning AFM’s as-well as practical demonstrations of the Bruker Dimension Fastscan and Multimode-8 AFM tools. Attendees are invited to bring their own samples to the workshop for measurement where the Bruker Nano-Surfaces team will showcase the capabilities of the AFM tools. A limited of timeslots (45 minutes each) are available for this in the afternoon on Wednesday 15th February. (An additional limited number of timeslots for measurement may be made available on Thursday 16th February 2017).
Spaces are limited. RSVPs are required by email to janine.galvin (at) tyndall (dot) ie no later than 13th February, 2017. Please indicate if you wish to sign up for a measurement timeslot on 15th February 2017. For technical questions regarding the event, contact Alan Blake alan (dot) blake (at) tyndall.ie.
Agenda can be viewed here