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Electron Microscopy

The Electron Microscopy and Analysis Facility (EMAF) at Tyndall, is committed to deliver state-of-the-art electron microscopy characterisation with rapid turnaround time for Industry and Academia. We develop customer and product specific analysis of materials and devices and provide comprehensive understanding of the measurement results.

Electron Microscopy
Thin oxide layer at an interface
E. coli bacteria in cryo-SEM 


  • Product contamination analysis
  • Thin film analysis (thickness + structure)
  • Failure analysis
  • Materials characterisation
  • Surface analysis
  • (S)TEM sample preparation
  • Trace analysis >10ppm
  • 3D visualisation
  • Soft material cryo imaging (polymers and life science specimen (bio/food/pharma))
  • Correlative microscopy
  • FIB patterning/prototyping
  • Nanoparticle analysis
Electron Microscopy
False coloured SEM image                         False coloured titanium signal of same image


  • Scanning electron microscopy (SEM)
  • Elemental analysis (EDX)
  • (Scanning) transmission electron microscopy (S)TEM
  • Dual beam focused ion beam (FIB)
  • Electron diffraction (SAED)
  • Cryo SEM for soft materials


EMAF Services and Methods


Contact enquiry (at) tyndall (dot) ie for all Business Development enquiries

Core Team