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Leader in Integrated ICT Hardware & Systems

Russell Duane - Staff

Russell Duane

Contact

+353 (0)21 2346201
russell.duane (at) tyndall (dot) ie

  • MNS (Circuits and Systems)

Dr. Duane has worked on a number of research projects in collaboration with industrial partners and has acted as a consultant in the area of semiconductor devices for a number of indigenous and multinational companies. He has been issued three U.S. patents in the area of semiconductor devices. Two of these patents were the outcome of an industrial collaboration with Bourns to investigate new over-voltage protection devices. Another patent on a novel memory device was issued as a result of his Ph.D. work. 

Dr. Duane currently leads an SFI funded research programme in the area of dielectric charging for MEMS devices. One of the papers from this programme was chosen last year by the Editors of Applied Physics Letters to be included in special edition Editor's Choice 2012 which represents the best research across the entire journal. He is also currently responsible for improving the performance of the Tyndall RADFET technology and has already significantly increased production yield and is currently investigating two novel device structures to increase sensitivity. He has published a number of articles in refereed journals and conference proceedings. 

Research Grants

  • EI Yield Enhancement Silicon overvoltage/overcurrent technology for ultra-low voltage mediam speed (Enterprise Irl) €96,307.00 (15-DEC-07 / 15-DEC-08)
  • Littlefuse - New Product Development (Foreign Industry) €30,700.00 (01-MAR-06 / 31-DEC-06)
  • Dielectric charging in capacitive MEMS devices in irradiating environment. (Irish Research Council for Science, Engineering & Technology (IRCSET)) €83,616.00 (01-JUL-10 / 01-JUN-13)
  • SFI 10/RFP/ECE2883 ; Study of Dielectric Charging in Capactive MEMS Swtiches (Science Foundation of Ireland) €172,730.00 (01-JUL-10 / 31-DEC-15)
  • [EU Contract No. 506844]{Duane Dr. R} V (European Union) €246,036.00 (01-JAN-04 / 31-DEC-06)
  • [IRCSET SC/02/198] {Duane, Dr.R.} N (Irish Research Council for Science, Engineering & Technology (IRCSET)) €140,225.00 (01-OCT-02 / 30-SEP-05)
  • [IF/2002/022]{Dr.Russell Duane} N (Enterprise Irl) €183,900.00 (01-JUL-02 / 30-JUN-04)
  • EI PC/2007/006 (Enterprise Irl) €98,126.00 (02-MAY-07 / 02-JUL-08)

Books

YearPublication

Peer Reviewed Journals

YearPublication
2014 A simple electrical test method to isolate viscoelasticity and creep in capacitive microelectromechanical switches
Ryan, C,Olszewski, Z,Houlihan, R,O'Mahony, C,Duane, R (2014) A simple electrical test method to isolate viscoelasticity and creep in capacitive microelectromechanical switches. : Applied Physics Letters. [Details]
2013 Radiochemistry on chip: towards dose-on-demand synthesis of PET radiopharmaceuticals
Arima, V,Pascali, G,Lade, O,Kretschmer, HR,Bernsdorf, I,Hammond, V,Watts, P,De Leonardis, F,Tarn, MD,Pamme, N,Cvetkovic, BZ,Dittrich, PS,Vasovic, N,Duane, R,Jaksic, A,Zacheo, A,Zizzari, A,Marra, L,Perrone, E,Salvadori, PA,Rinaldi, R (2013) Radiochemistry on chip: towards dose-on-demand synthesis of PET radiopharmaceuticals. : Lab On A Chip. [Details]
2012 Experimental isolation of degradation mechanisms in capacitive microelectromechanical switches
Olszewski, Z,Houlihan, R,Ryan, C,O'Mahony, C,Duane, R (2012) Experimental isolation of degradation mechanisms in capacitive microelectromechanical switches. : Applied Physics Letters. [Details]
2012 Addendum:“A study of capacitance-voltage curve narrowing effect in capacitive microelectromechanical switches”[Appl. Phys. Lett. 93, 094101 (2008)]
Olszewski, Z.,Houlihan, R.,O’Mahony, C.,Duane, R (2012) Addendum:“A study of capacitance-voltage curve narrowing effect in capacitive microelectromechanical switches”[Appl. Phys. Lett. 93, 094101 (2008)]. : Applied Physics Letters. [Details]
2011 Thermal stability of SiC Schottky diode anode and cathode metalisations after 1000 h at 350 degrees C
O'Mahony, D,Duane, R,Campagno, T,Lewis, L,Cordero, N,Maaskant, P,Waldron, F,Corbett, B (2011) Thermal stability of SiC Schottky diode anode and cathode metalisations after 1000 h at 350 degrees C. : Microelectronics Reliability. [Details]
2010 Investigation of Back-Bias Capacitance Coupling Coefficient Measurement Methodology for Floating-Gate Nonvolatile Memory Cells
Beug, MF,Rafhay, Q,van Duuren, MJ,Duane, R (2010) Investigation of Back-Bias Capacitance Coupling Coefficient Measurement Methodology for Floating-Gate Nonvolatile Memory Cells. : IEEE Transactions On Electron Devices. [Details]
2010 LDD and Back-Gate Engineering for Fully Depleted Planar SOI Transistors with Thin Buried Oxide
Yan, R,Duane, R,Razavi, P,Afzalian, A,Ferain, I,Lee, CW,Akhavan, ND,Nguyen, BY,Bourdelle, KK,Colinge, JP (2010) LDD and Back-Gate Engineering for Fully Depleted Planar SOI Transistors with Thin Buried Oxide. : IEEE Transactions On Electron Devices. [Details]
2009 Comment on Comparison of air breakdown and substrate injection as mechanisms to induce dielectric charging in microelectromechanical switches [Appl. Phys. Lett. 92, 043502 (2008)]
Olszewski, Z.,O'Mahony, C.,Houlihan, R.,Duane, R (2009) Comment on Comparison of air breakdown and substrate injection as mechanisms to induce dielectric charging in microelectromechanical switches [Appl. Phys. Lett. 92, 043502 (2008)]. : Applied Physics Letters. [Details]
2008 A study of capacitance-voltage curve narrowing effect in capacitive microelectromechanical switches
Olszewski, Z.,Duane, R.,O'Mahony, C (2008) A study of capacitance-voltage curve narrowing effect in capacitive microelectromechanical switches. : Applied Physics Letters. [Details]
2007 Extraction of the gate capacitance coupling coefficient in floating gate non-volatile memories: Statistical study of the effect of mismatching between floating gate memory and reference transistor in dummy cell extraction methods
Rafhay, Q,Beug, MF,Duane, R (2007) Extraction of the gate capacitance coupling coefficient in floating gate non-volatile memories: Statistical study of the effect of mismatching between floating gate memory and reference transistor in dummy cell extraction methods. : Solid-State Electronics. [Details]
2007 Investigation into the effect that probe immobilisation method type has on the analytical signal of an EIS DNA biosensor
Lillis, B,Manning, M,Hurley, E,Berney, H,Duane, R,Mathewson, A,Sheehan, MM (2007) Investigation into the effect that probe immobilisation method type has on the analytical signal of an EIS DNA biosensor. : Biosensors & Bioelectronics. [Details]
2007 Measurement and. analysis of PD-SOI static latches based on bistable-gated-bipolar device
Cheng, X,Duane, R (2007) Measurement and. analysis of PD-SOI static latches based on bistable-gated-bipolar device. : IEEE Journal of Solid-State Circuits. [Details]
2007 Intrinsic Mismatch Between Floating-Gate Nonvolatile Memory Cell and Equivalent Transistor
Duane, R, Rafhay, Q, Beug, MF, van Duuren, M (2007) Intrinsic Mismatch Between Floating-Gate Nonvolatile Memory Cell and Equivalent Transistor. : IEEE Electron Device Letters. [Details]
2007 Intrinsic mismatch between floating-gate nonvolatile memory cell and equivalent transistor
Duane, R,Rafhay, Q,Beug, MF,van Duuren, M (2007) Intrinsic mismatch between floating-gate nonvolatile memory cell and equivalent transistor. : IEEE Electron Device Letters. [Details]
2007 Investigation Into The Effect That Probe Immobilisation Method Type Has On The Analytical Signal of An Eis Dna Biosensor
Lillis, B, Manning, M, Hurley, E, Berney, H, Duane, R, Mathewson, A, Sheehan, MM (2007) Investigation Into The Effect That Probe Immobilisation Method Type Has On The Analytical Signal of An Eis Dna Biosensor. : Biosensors & Bioelectronics. [Details]
2006 0.6V D flip-flop utilising negative differential resistance device
Cheng, X,Duane, R (2006) 0.6V D flip-flop utilising negative differential resistance device. : Electronic Letters. [Details]
2006 A Comprehensive Study of Bistable Gated Bipolar Device
Cheng, X, Duane, R (2006) A Comprehensive Study of Bistable Gated Bipolar Device. : IEEE Transactions On Electron Devices. [Details]
2005 Low-voltage micromechanical test structures for measurement of residual charge in dielectrics
O'Mahony, C,Duane, R,Hill, M,Mathewson, A (2005) Low-voltage micromechanical test structures for measurement of residual charge in dielectrics. : Electronics Letters. [Details]
2005 Two D flip-flops based on bistable-gated-bipolar devices
Cheng, X,Duane, R,Mathewson, A (2005) Two D flip-flops based on bistable-gated-bipolar devices. : Electronic Letters. [Details]
2005 Low-voltage micromechanical test structures for measurement of residual charge in dielectrics
O'Mahony, C.,Duane, R.,Hill, M.,Mathewson, A (2005) Low-voltage micromechanical test structures for measurement of residual charge in dielectrics. : Electronics Letters. [Details]
2005 Characterization, modelling and performance evaluation of CMOS integrated multielectrode tunable capacitor (MTC)
Olszewski, Z,Hilll, M,O'Mahony, C,Duane, R,Houlihan, R (2005) Characterization, modelling and performance evaluation of CMOS integrated multielectrode tunable capacitor (MTC). : Journal of Micromechanics and Microengineering. [Details]
2005 Novel capacitance coupling coefficient measurement methodology for floating gate nonvolatile memory devices
Duane, R,Beug, MF,Mathewson, A (2005) Novel capacitance coupling coefficient measurement methodology for floating gate nonvolatile memory devices. : IEEE Electron Device Letters. [Details]
2005 Characterization, modelling and performance evaluation of CMOS integrated multielectrode tunable capacitor (MTC)
Olszewski, Z.,Hilll, M.,O'Mahony, C.,Duane, R.,Houlihan, R (2005) Characterization, modelling and performance evaluation of CMOS integrated multielectrode tunable capacitor (MTC). : Journal of Micromechanics and Microengineering. [Details]
2003 Improving the Accuracy and Efficiency of Junction Capacitance Characterization: Strategies for Probing Configuration and Data Set Size
MacSweeney,D.; McCarthy,K.G.; Floyd,L.; Duane,R.; Hurley, P.; Power, J.A.; Kelly, S.C.; Mathewson, A (2003) Improving the Accuracy and Efficiency of Junction Capacitance Characterization: Strategies for Probing Configuration and Data Set Size. : IEEE Transactions on Semiconductor Manufacturing. [Details]
2003 Analysis of electromechanical boundary effects on the pull-in of micromachined fixed-fixed beams
O'Mahony, C,Hill, M,Duane, R,Mathewson, A (2003) Analysis of electromechanical boundary effects on the pull-in of micromachined fixed-fixed beams. : Journal of Micromechanics and Microengineering. [Details]
2003 Characterization of micromechanical structures using white-light interferometry
O'Mahony, C,Hill, M,Brunet, M,Duane, R,Mathewson, A (2003) Characterization of micromechanical structures using white-light interferometry. : Measurement Science &Technology. [Details]
2003 Analysis of electromechanical boundary effects on the pull-in of micromachined fixed–fixed beams
O'Mahony, C.,Hill, M.,Duane, R.,Mathewson, A (2003) Analysis of electromechanical boundary effects on the pull-in of micromachined fixed–fixed beams. : Journal of Micromechanics and Microengineering. [Details]
2003 Improving the accuracy and efficiency of junction capacitance characterization: Strategies for probing configuration and data set size
MacSweeney, D,McCarthy, KG,Floyd, L,Duane, R,Hurley, P,Power, JA,Kelly, SC,Mathewson, A (2003) Improving the accuracy and efficiency of junction capacitance characterization: Strategies for probing configuration and data set size. : IEEE Transactions on Semiconductor Manufacturing. [Details]
2003 Compact model development for a new nonvolatile memory cell architecture
O'Shea, M,Duane, R,McCarthy, D,McCarthy, KG,Concannon, A,Mathewson, A (2003) Compact model development for a new nonvolatile memory cell architecture. : IEEE Transactions on Semiconductor Manufacturing. [Details]
2003 A novel CMOS-compatible top-floating-gate EEPROM cell for embedded applications
Mc Carthy, D., Duane, R., O'Shea, M., Duffy, R., Mc Carthy, K., Kelliher, A.-M., Concannon, A., Mathewson, A (2003) A novel CMOS-compatible top-floating-gate EEPROM cell for embedded applications. : IEEE Transactions On Electron Devices. [Details]
2003 Performance and reliability of post-CMOS metal/oxide MEMS for RF application
Hill, M,O' Mahony, C,Duane, R,Mathewson, A (2003) Performance and reliability of post-CMOS metal/oxide MEMS for RF application. : Journal of Micromechanics and Microengineering. [Details]
2003 Bistable gated bipolar device
Duane, R,Mathewson, A,Concannon, A (2003) Bistable gated bipolar device. : IEEE Electron Device Letters. [Details]
2003 Compact Model Development for a New Non-Volatile Memory Cell Architecture
O'Shea,M.; Duane,R.; McCarthy,D.; McCarthy,K.G.; Concannon,A.; Mathewson,A (2003) Compact Model Development for a New Non-Volatile Memory Cell Architecture. : IEEE Transactions on Semiconductor Manufacturing. [Details]
2001 Extraction of coupling ratios for Fowler-Nordheim programming conditions
Duane, R,Concannon, A,O'Sullivan, P,O'Shea, M,Mathewson, A (2001) Extraction of coupling ratios for Fowler-Nordheim programming conditions. : Solid-State Electronics. [Details]
2000 Design for reliability
Minehane, S,Duane, R,O'Sullivan, P,McCarthy, KG,Mathewson, A (2000) Design for reliability. : Microelectronics Reliability. [Details]
2000 Design for Reliability
Minehane,S.; Duane,R.; O'Sullivan,P.; McCarthy,K.G.; Mathewson,A (2000) Design for Reliability. : Microelectronics and Reliability. [Details]
1999 Modelling and simulation of reliability for design
Mathewson, A,O'Sullivan, P,Concannon, A,Foley, S,Minehane, S,Duane, R,Palser, K (1999) Modelling and simulation of reliability for design. : Microelectronic Engineering. [Details]
1998 Dependence of gate oxide breakdown on initial charge trapping under Fowler-Nordheim injection
Martin, A,Duane, R,O'Sullivan, P,Mathewson, A (1998) Dependence of gate oxide breakdown on initial charge trapping under Fowler-Nordheim injection. : Microelectronics and Reliability. [Details]

Other Journals

YearPublication

Conference Publications

YearPublication
Year2014 Publication9th ESA Round Table on MNT for Space Applications
Houlihan, R.,Duane, R.,Ryan, C.,O'Mahony, C.,Olszewski, O. Z (2014) MEMS Technology for SPACE applications at Tyndall National Institute. : . [Details]
Year2003 PublicationMicromechanics Europe 2003
O'Mahony, C.,Hill, M.,Duane, R.,Kelleher, AM,Mathewson, A (2003) Effects of dielectric charging on the reliability of capacitive microswitches. : . [Details]
Year2012 PublicationDesign, Test, Integration and Packaging of MEMS/MOEMS - DTIP 2012
Olszewski, O. Z. ,Houlihan, R. ,O'Mahony, C.,Ryan, C. ,Duane, R (2012) Experimental MEMS capacitive switch with stable actuation voltage over a broad temperature range. : . [Details]
Year2012 Publication8th ESA Round-Table on MNT for Space Applications
Olszewski, O. Z. ,Houlihan, R. ,O'Mahony, C. ,Ryan, C. ,Duane, R (2012) Isolation of Degradation Mechanisms in Capacitive Microelectromechanical Switches. : . [Details]
Year2012 PublicationRoyal Irish Academy Communications and Radio Science Colloquium
Ryan, C. ,Olszewski, O. Z. ,Houlihan, R. ,O'Mahony, C.,Duane, R (2012) Design For Reliability in RF MEMS Capacitive Switches. : . [Details]
Year2009 PublicationMicromechanics Europe 2009
Houlihan, R.,Olszewski, O. Z.,Duane, R.,O'Mahony, C.,Collins, P.,Mathewson, A (2009) System-Level Reliability of a Capacitive MEMS Switch. : . [Details]
Year2008 PublicationMEMSWAVE 2008
Olszewski, O. Z.,Duane, R.,O'Mahony, C (2008) Effect of Environmental Humidity on the C-V Characteristics of RF MEMS capacitive Switch. : . [Details]
Year2008 PublicationIntel Ireland Research Conference
Olszewski, O. Z.,Duane, R.,O'Mahony, C (2008) C-V Characteristic Instability of RF MEMS capacitive Switch. : . [Details]
Year2007 PublicationMicroNanoReliability 2007
Olszewski, O. Z.,O'Mahony, C.,Duane, R.,Hill, M (2007) The Role of Surface Roughness in RF MEMS Capacitive Switches. : . [Details]
Year2004 PublicationMicromechanics Europe 2004
O'Mahony, C.,Duane, R.,Hill, M.,Mathewson, A (2004) A long lifetime, low voltage, capacitive RF microswitch. : . [Details]
Year2004 PublicationWorkshop on Dielectrics in Microelectronics
O'Mahony, C.,Duane, R.,Hill, M.,Mathewson, A (2004) Reliable Dielectrics for Micromachined RF Switches. : . [Details]
Year2004 PublicationMicromechanics Europe 2004
Olszewski, O. Z.,Hill, M.,O'Mahony, C.,Duane, R (2004) Characterisation of CMOS Integrated Multielectrode Tunable Capacitor. : . [Details]
Year2002 PublicationMIGAS Summer School 2002
O'Mahony, C.,Hill, M.,Duane, R.,Mathewson, A (2002) Titanium-based Microswitches. : . [Details]
Year2002 PublicationInternational Conference on Microelectronic Test Structures (ICMTS 2002)
O'Shea,M.; McCarthy,D.; Duane,R.; McCarthy,K.G.; Concannon,A.; Mathewson,A (2002) Compact Model Development for a New Non-Volatile Memory Cell Architecture . In: Walton,A.J.; Mathewson, A eds. : . [Details]
Year2014 PublicationMEMSWAVE
Ryan, C.,Olszewski, O. Z.,Houlihan, R.,O'Mahony, C.,Blake, A.,Duane, R (2014) Investigation of Bipolar Dielectric Charging in RF MEMS Capacitive Switches. : . [Details]
Year2003 PublicationProceedings of SPIE - The International Society for Optical Engineering
Mathewson, A.; Duane, R.; Wrixon, G. T (2003) CMOS compatible avalanche photodiode (APD) arrays . In: * eds. : . [Details]
Year2010 Publication7th ESA Round Table on MNT for Space Applications
Olszewski, Z.,O'Mahony, C.,Houlihan, R.,Duane, R (2010) A Novel charging Concept in Capacitive RF MEMS. : . [Details]
Year2005 PublicationIntel Ireland Research Conference
Olszewski, O. Z.,O'Mahony, C.,Duane, R (2005) Reliability of MEMS-based Capacitive RF Switches. : . [Details]
Year2002 PublicationInternational Conference on Microelectronic Test Structures (ICMTS 2002)
McCarthy,D.; O’Shea,M.; Duane,R. McCarthy,K.G.; Concannon,A,; Mathewson,A (2002) Extraction of Coupling Coefficients for the Top-Floating-Gate (TFG) Flash EEPROM Cell . In: Walton, A.J,; Mathewson,A eds. : . [Details]
Year2013 PublicationMicromechanics Europe 2013
Ryan, C.,Olszewski, Z.,Houlihan, R.,O’Mahony, C.,Duane, R (2013) Tether Design for Radio-Frequency Capacitive Switches. : . [Details]
Year2004 PublicationIEEE Design, Test, Integration and Packaging of MEMS (DTIP) 2004
O'Mahony, C.,Hill, M.,Duane, R.,Mathewson, A (2004) Electromechanical Modelling of Low-Voltage RF MEMS Switches. : . [Details]
Year2012 PublicationRAD2012: The First International Conference on Radiation and Dosimetry in Various Fields of Research
Ryan, C. ,Olszewski, O. Z. ,Houlihan, R. ,O'Mahony, C.,Duane, R (2012) Capacitive Microelectromechanical Switches for Space Applications. : . [Details]

Patents

  • 6,603,155
  • 6,639,253
  • 6310799

Journal Activities

  • Referee, Ieee Electron Device Letters (-)
  • Referee, Ieee Transactions On Electron Devices (-)
  • Referee, Journal Of Applied Physics (-)
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