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Biography
Dr. Duane has worked on a number of research projects in collaboration with industrial partners and has acted as a consultant in the area of semiconductor devices for a number of indigenous and multinational companies. He has been issued three U.S. patents in the area of semiconductor devices. Two of these patents were the outcome of an industrial collaboration with Bourns to investigate new over-voltage protection devices. Another patent on a novel memory device was issued as a result of his Ph.D. work.
Dr. Duane currently leads an SFI funded research programme in the area of dielectric charging for MEMS devices. One of the papers from this programme was chosen last year by the Editors of Applied Physics Letters to be included in special edition Editor’s Choice 2012 which represents the best research across the entire journal. He is also currently responsible for improving the performance of the Tyndall RADFET technology and has already significantly increased production yield and is currently investigating two novel device structures to increase sensitivity. He has published a number of articles in refereed journals and conference proceedings.
Research Interests
Research Grants
| Funder | Start Date | End Date | Title | Role |
|---|---|---|---|---|
| Foreign Industry | 01-MAR-06 | 31-DEC-06 | Littlefuse – New Product Development | Principal Investigator |
| Enterprise Irl | 15-DEC-07 | 15-DEC-08 | EI Yield Enhancement Silicon overvoltage/overcurrent technology for ultra-low voltage mediam speed | Principal Investigator |
| European Union | 01-JAN-04 | 31-DEC-06 | [EU Contract No. 506844]{Duane Dr. R} V | Principal Investigator |
| Science Foundation of Ireland | 01-JUL-10 | 31-DEC-15 | SFI 10/RFP/ECE2883 ; Study of Dielectric Charging in Capactive MEMS Swtiches | Principal Investigator |
| Irish Research Council for Science, Engineering & Technology (IRCSET) | 01-JUL-10 | 01-JUN-13 | Dielectric charging in capacitive MEMS devices in irradiating environment. | Principal Investigator |
| Enterprise Irl | 01-JUL-02 | 30-JUN-04 | [IF/2002/022]{Dr.Russell Duane} N | Principal Investigator |
| Irish Research Council for Science, Engineering & Technology (IRCSET) | 01-OCT-02 | 30-SEP-05 | [IRCSET SC/02/198] {Duane, Dr.R.} N | Principal Investigator |
| Enterprise Irl | 02-MAY-07 | 02-JUL-08 | EI PC/2007/006 | Principal Investigator |
Publications
Conference Publications
| Year | Publication |
|---|---|
| 2014 | MEMSWAVE Ryan, C.,Olszewski, O. Z.,Houlihan, R.,O’Mahony, C.,Blake, A.,Duane, R. (2014) MEMSWAVE. : . |
| 2014 | 9th ESA Round Table on MNT for Space Applications Houlihan, R.,Duane, R.,Ryan, C.,O’Mahony, C.,Olszewski, O. Z. (2014) 9th ESA Round Table on MNT for Space Applications. : . |
| 2013 | Micromechanics Europe 2013 Ryan, C.,Olszewski, Z.,Houlihan, R.,O’Mahony, C.,Duane, R. (2013) Micromechanics Europe 2013. : . |
| 2012 | 8th ESA Round-Table on MNT for Space Applications, Olszewski, O. Z. ,Houlihan, R. ,O’Mahony, C. ,Ryan, C. ,Duane, R. (2012) 8th ESA Round-Table on MNT for Space Applications,. : . |
| 2012 | Royal Irish Academy Communications and Radio Science Colloquium Ryan, C. ,Olszewski, O. Z. ,Houlihan, R. ,O’Mahony, C.,Duane, R. (2012) Royal Irish Academy Communications and Radio Science Colloquium. : . |
| 2012 | RAD2012: The First International Conference on Radiation and Dosimetry in Various Fields of Research Ryan, C. ,Olszewski, O. Z. ,Houlihan, R. ,O’Mahony, C.,Duane, R. (2012) RAD2012: The First International Conference on Radiation and Dosimetry in Various Fields of Research. : . |
| 2012 | Design, Test, Integration and Packaging of MEMS/MOEMS – DTIP 2012 Olszewski, O. Z. ,Houlihan, R. ,O’Mahony, C.,Ryan, C. ,Duane, R. (2012) Design, Test, Integration and Packaging of MEMS/MOEMS – DTIP 2012. : . |
| 2010 | 7th ESA Round Table on MNT for Space Applications Olszewski, Z.,O’Mahony, C.,Houlihan, R.,Duane, R. (2010) 7th ESA Round Table on MNT for Space Applications. : . |
| 2009 | Micromechanics Europe 2009 Houlihan, R.,Olszewski, O. Z.,Duane, R.,O’Mahony, C.,Collins, P.,Mathewson, A. (2009) Micromechanics Europe 2009. : . |
| 2008 | Intel Ireland Research Conference Olszewski, O. Z.,Duane, R.,O’Mahony, C. (2008) Intel Ireland Research Conference. : . |
| 2008 | MEMSWAVE 2008 Olszewski, O. Z.,Duane, R.,O’Mahony, C. (2008) MEMSWAVE 2008. : . |
| 2007 | MicroNanoReliability 2007 Olszewski, O. Z.,O’Mahony, C.,Duane, R.,Hill, M. (2007) MicroNanoReliability 2007. : . |
| 2005 | Intel Ireland Research Conference Olszewski, O. Z.,O’Mahony, C.,Duane, R. (2005) Intel Ireland Research Conference. : . |
| 2004 | IEEE Design, Test, Integration and Packaging of MEMS (DTIP) 2004 O’Mahony, C.,Hill, M.,Duane, R.,Mathewson, A. (2004) IEEE Design, Test, Integration and Packaging of MEMS (DTIP) 2004. : . |
| 2004 | Workshop on Dielectrics in Microelectronics O’Mahony, C.,Duane, R.,Hill, M.,Mathewson, A. (2004) Workshop on Dielectrics in Microelectronics. : . |
| 2004 | Micromechanics Europe 2004 O’Mahony, C.,Duane, R.,Hill, M.,Mathewson, A. (2004) Micromechanics Europe 2004. : . |
| 2004 | Micromechanics Europe 2004 Olszewski, O. Z.,Hill, M.,O’Mahony, C.,Duane, R. (2004) Micromechanics Europe 2004. : . |
| 2003 | Proceedings of SPIE – The International Society for Optical Engineering Mathewson, A.; Duane, R.; Wrixon, G. T.; (2003) Proceedings of SPIE – The International Society for Optical Engineering. : . |
| 2003 | Micromechanics Europe 2003 O’Mahony, C.,Hill, M.,Duane, R.,Kelleher, AM,Mathewson, A. (2003) Micromechanics Europe 2003. : . |
| 2002 | International Conference on Microelectronic Test Structures (ICMTS 2002) McCarthy,D.; O’Shea,M.; Duane,R. McCarthy,K.G.; Concannon,A,; Mathewson,A.; (2002) International Conference on Microelectronic Test Structures (ICMTS 2002). : . |
| 2002 | International Conference on Microelectronic Test Structures (ICMTS 2002) O’Shea,M.; McCarthy,D.; Duane,R.; McCarthy,K.G.; Concannon,A.; Mathewson,A.; (2002) International Conference on Microelectronic Test Structures (ICMTS 2002). : . |
| 2002 | MIGAS Summer School 2002 O’Mahony, C.,Hill, M.,Duane, R.,Mathewson, A. (2002) MIGAS Summer School 2002. : . |
Peer Reviewed Journals
| Year | Journal | Publication |
|---|---|---|
| 2014 | Applied Physics Letters | A simple electrical test method to isolate viscoelasticity and creep in capacitive microelectromechanical switches Ryan, C,Olszewski, Z,Houlihan, R,O’Mahony, C,Duane, R (2014) A simple electrical test method to isolate viscoelasticity and creep in capacitive microelectromechanical switches. : . |
| 2013 | Lab On A Chip | Radiochemistry on chip: towards dose-on-demand synthesis of PET radiopharmaceuticals Arima, V,Pascali, G,Lade, O,Kretschmer, HR,Bernsdorf, I,Hammond, V,Watts, P,De Leonardis, F,Tarn, MD,Pamme, N,Cvetkovic, BZ,Dittrich, PS,Vasovic, N,Duane, R,Jaksic, A,Zacheo, A,Zizzari, A,Marra, L,Perrone, E,Salvadori, PA,Rinaldi, R (2013) Radiochemistry on chip: towards dose-on-demand synthesis of PET radiopharmaceuticals. : . |
| 2012 | Applied Physics Letters | Experimental isolation of degradation mechanisms in capacitive microelectromechanical switches Olszewski, Z,Houlihan, R,Ryan, C,O’Mahony, C,Duane, R (2012) Experimental isolation of degradation mechanisms in capacitive microelectromechanical switches. : . |
| 2012 | Applied Physics Letters | Addendum:“A study of capacitance-voltage curve narrowing effect in capacitive microelectromechanical switches”[Appl. Phys. Lett. 93, 094101 (2008)] Olszewski, Z.,Houlihan, R.,O’Mahony, C.,Duane, R. (2012) Addendum:“A study of capacitance-voltage curve narrowing effect in capacitive microelectromechanical switches”[Appl. Phys. Lett. 93, 094101 (2008)]. : . |
| 2011 | Microelectronics Reliability | Thermal stability of SiC Schottky diode anode and cathode metalisations after 1000 h at 350 degrees C O’Mahony, D; Duane, R; Campagno, T; Lewis, L; Cordero, N; Maaskant, P; Waldron, F; Corbett, B (2011) Thermal stability of SiC Schottky diode anode and cathode metalisations after 1000 h at 350 degrees C. : . |
| 2010 | IEEE Transactions On Electron Devices | LDD and Back-Gate Engineering for Fully Depleted Planar SOI Transistors with Thin Buried Oxide Yan, R,Duane, R,Razavi, P,Afzalian, A,Ferain, I,Lee, CW,Akhavan, ND,Nguyen, BY,Bourdelle, KK,Colinge, JP; (2010) LDD and Back-Gate Engineering for Fully Depleted Planar SOI Transistors with Thin Buried Oxide. : . |
| 2009 | Applied Physics Letters | Comment on “Comparison of air breakdown and substrate injection as mechanisms to induce dielectric charging in microelectromechanical switches” [Appl. Phys. Lett. 92, 043502 (2008)] Olszewski, Z.,O’Mahony, C.,Houlihan, R.,Duane, R. (2009) Comment on “Comparison of air breakdown and substrate injection as mechanisms to induce dielectric charging in microelectromechanical switches” [Appl. Phys. Lett. 92, 043502 (2008)]. : . |
| 2008 | Applied Physics Letters | A study of capacitance-voltage curve narrowing effect in capacitive microelectromechanical switches Olszewski, Z.,Duane, R.,O’Mahony, C. (2008) A study of capacitance-voltage curve narrowing effect in capacitive microelectromechanical switches. : . |
| 2007 | IEEE Electron Device Letters | Intrinsic mismatch between floating-gate nonvolatile memory cell and equivalent transistor Duane, R,Rafhay, Q,Beug, MF,van Duuren, M; (2007) Intrinsic mismatch between floating-gate nonvolatile memory cell and equivalent transistor. : . |
| 2007 | Biosensors & Bioelectronics | Investigation into the effect that probe immobilisation method type has on the analytical signal of an EIS DNA biosensor Lillis, B,Manning, M,Hurley, E,Berney, H,Duane, R,Mathewson, A,Sheehan, MM; (2007) Investigation into the effect that probe immobilisation method type has on the analytical signal of an EIS DNA biosensor. : . |
| 2007 | IEEE Journal of Solid-State Circuits | Measurement and. analysis of PD-SOI static latches based on bistable-gated-bipolar device Cheng, X,Duane, R; (2007) Measurement and. analysis of PD-SOI static latches based on bistable-gated-bipolar device. : . |
| 2007 | Biosensors & Bioelectronics | Investigation Into The Effect That Probe Immobilisation Method Type Has On The Analytical Signal of An Eis Dna Biosensor Lillis, B, Manning, M, Hurley, E, Berney, H, Duane, R, Mathewson, A, Sheehan, MM; (2007) Investigation Into The Effect That Probe Immobilisation Method Type Has On The Analytical Signal of An Eis Dna Biosensor. : . |
| 2007 | IEEE Electron Device Letters | Intrinsic Mismatch Between Floating-Gate Nonvolatile Memory Cell and Equivalent Transistor Duane, R, Rafhay, Q, Beug, MF, van Duuren, M; (2007) Intrinsic Mismatch Between Floating-Gate Nonvolatile Memory Cell and Equivalent Transistor. : . |
| 2007 | Solid-State Electronics | Extraction of the gate capacitance coupling coefficient in floating gate non-volatile memories: Statistical study of the effect of mismatching between floating gate memory and reference transistor in dummy cell extraction methods Rafhay, Q,Beug, MF,Duane, R (2007) Extraction of the gate capacitance coupling coefficient in floating gate non-volatile memories: Statistical study of the effect of mismatching between floating gate memory and reference transistor in dummy cell extraction methods. : . |
| 2006 | Electronic Letters | 0.6V D flip-flop utilising negative differential resistance device Cheng, X,Duane, R; (2006) 0.6V D flip-flop utilising negative differential resistance device. : . |
| 2006 | IEEE Transactions On Electron Devices | A Comprehensive Study of Bistable Gated Bipolar Device Cheng, X, Duane, R; (2006) A Comprehensive Study of Bistable Gated Bipolar Device. : . |
| 2005 | Journal of Micromechanics and Microengineering | Characterization, modelling and performance evaluation of CMOS integrated multielectrode tunable capacitor (MTC) Olszewski, Z.,Hilll, M.,O’Mahony, C.,Duane, R.,Houlihan, R. (2005) Characterization, modelling and performance evaluation of CMOS integrated multielectrode tunable capacitor (MTC). : . |
| 2005 | Electronics Letters | Low-voltage micromechanical test structures for measurement of residual charge in dielectrics O’Mahony, C.,Duane, R.,Hill, M.,Mathewson, A. (2005) Low-voltage micromechanical test structures for measurement of residual charge in dielectrics. : . |
| 2003 | Journal of Micromechanics and Microengineering | Analysis of electromechanical boundary effects on the pull-in of micromachined fixed–fixed beams O’Mahony, C.,Hill, M.,Duane, R.,Mathewson, A. (2003) Analysis of electromechanical boundary effects on the pull-in of micromachined fixed–fixed beams. : . |
| 2003 | IEEE Transactions on Semiconductor Manufacturing | Improving the accuracy and efficiency of junction capacitance characterization: Strategies for probing configuration and data set size MacSweeney, D,McCarthy, KG,Floyd, L,Duane, R,Hurley, P,Power, JA,Kelly, SC,Mathewson, A (2003) Improving the accuracy and efficiency of junction capacitance characterization: Strategies for probing configuration and data set size. : . |
| 2003 | IEEE Electron Device Letters | Bistable gated bipolar device Duane, R,Mathewson, A,Concannon, A; (2003) Bistable gated bipolar device. : . |
| 2003 | IEEE Transactions on Semiconductor Manufacturing | Compact Model Development for a New Non-Volatile Memory Cell Architecture O’Shea,M.; Duane,R.; McCarthy,D.; McCarthy,K.G.; Concannon,A.; Mathewson,A.; (2003) Compact Model Development for a New Non-Volatile Memory Cell Architecture. : . |
| 2003 | IEEE Transactions on Semiconductor Manufacturing | Improving the Accuracy and Efficiency of Junction Capacitance Characterization: Strategies for Probing Configuration and Data Set Size MacSweeney,D.; McCarthy,K.G.; Floyd,L.; Duane,R.; Hurley, P.; Power, J.A.; Kelly, S.C.; Mathewson, A.; (2003) Improving the Accuracy and Efficiency of Junction Capacitance Characterization: Strategies for Probing Configuration and Data Set Size. : . |
| 2003 | IEEE Transactions On Electron Devices | A novel CMOS-compatible top-floating-gate EEPROM cell for embedded applications Mc Carthy, D., Duane, R., O’Shea, M., Duffy, R., Mc Carthy, K., Kelliher, A.-M., Concannon, A., Mathewson, A. (2003) A novel CMOS-compatible top-floating-gate EEPROM cell for embedded applications. : . |
| 2003 | Journal of Micromechanics and Microengineering | Analysis of electromechanical boundary effects on the pull-in of micromachined fixed-fixed beams O’Mahony, C,Hill, M,Duane, R,Mathewson, A (2003) Analysis of electromechanical boundary effects on the pull-in of micromachined fixed-fixed beams. : . |
| 2003 | Measurement Science &Technology | Characterization of micromechanical structures using white-light interferometry O’Mahony, C,Hill, M,Brunet, M,Duane, R,Mathewson, A (2003) Characterization of micromechanical structures using white-light interferometry. : . |
| 2003 | Journal of Micromechanics and Microengineering | Performance and reliability of post-CMOS metal/oxide MEMS for RF application Hill, M,O’ Mahony, C,Duane, R,Mathewson, A (2003) Performance and reliability of post-CMOS metal/oxide MEMS for RF application. : . |
| 2000 | Microelectronics and Reliability | Design for Reliability Minehane,S.; Duane,R.; O’Sullivan,P.; McCarthy,K.G.; Mathewson,A.; (2000) Design for Reliability. : . |
| 2000 | Microelectronics Reliability | Design for reliability Minehane, S,Duane, R,O’Sullivan, P,McCarthy, KG,Mathewson, A (2000) Design for reliability. : . |
| 1999 | Microelectronic Engineering | Modelling and simulation of reliability for design Mathewson, A,O’Sullivan, P,Concannon, A,Foley, S,Minehane, S,Duane, R,Palser, K (1999) Modelling and simulation of reliability for design. : . |
| 1998 | Microelectronics and Reliability | Dependence of gate oxide breakdown on initial charge trapping under Fowler-Nordheim injection Martin, A,Duane, R,O’Sullivan, P,Mathewson, A (1998) Dependence of gate oxide breakdown on initial charge trapping under Fowler-Nordheim injection. : . |
Professional Activities
Journal Activities
- IEEE Transactions on Electron Devices – Referee
- IEEE Electron Device Letters – Referee
- J Appl Phys – Referee
Other Professional Activities
- Reviewer of proposals in the area of flash memory for Flemish government.
Patents
- [2001] 6310799 – A negative resistance device
- [2003] 6,639,253 – overvoltage protection device
- [2003] 6,603,155 – overvoltage protection device